Conference Papers
Year : 2008
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https://audencia.hal.science/hal-00797406
Submitted on : Wednesday, March 6, 2013-12:12:43 PM
Last modification on : Friday, March 22, 2024-11:32:03 AM
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- HAL Id : hal-00797406 , version 1
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Christophe Villa, Francis X. Diebold. Representative yield curve shocks and stress testing. 6th Finance International Meeting, Dec 2008, Paris, France. ⟨hal-00797406⟩
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