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Dépôts en texte intégral
93
Mots clés
Annealing
Ageing
Indium oxide
Aluminium
13C
Kossel diffraction
Charge exchange
Periodic multilayer
3C-SiC
Epitaxial growth
Interface defects
X-ray diffraction
7630Lh
Nanoparticles
Hysteresis
Ion implantation
17O
Magnetic anisotropy
7550Pp
Zinc oxide
RBS
Nuclear resonance profiling NRP
Oxygen deficiency
Nuclear reaction analysis
Atomic Layer Deposition ALD
Nitridation
Silicon
15N
Silicon carbide
Alloy
Transparent conductive oxide TCO
18O
Pb centers
GaMnAs
Adsorption Isotherms
Density functional theory
6855Jk
HfO2
2H
Diffusion
Gold
Silica
Ion beam analysis
Growth
Topological insulators
Magnetic semiconductors
27Aldp
Raman spectroscopy
Magnetization curves
XPS
Oxidation
Gallium oxide
Metal-insulator transition
Defects
AC susceptibility
Al2O3
AFM
Pulsed laser deposition
SiC
Passivation
Thin film
Acoustic propreties of solid
Nickel
Thin films
Adsorption
Energy loss
Photoluminescence
Measurement
8140Ef
Low energy electron diffraction LEED
7550Ee
Stable isotopic tracing
17Op
Capillary condensation
ALD
Evaluation
27Ald p&α
18O resonance
ADSORPTION DESORPTION HYSTERESIS
PIXE
Silicon Carbide
Nanostructures
27Alda
Epitaxy
17Opp
Sputtering
EPR
Aluminum
Auger electron spectroscopy AES
XRD
Rutherford backscattering spectrometry RBS
Channeling
Alloys
Isotopic Tracing
Adsorbed layers
Acoustic
NRP
Ferromagnetic resonance
Multilayer
Topological defects